
Overview
Etched stainless steel grating uses photochemical machining to cut precise line, slot and bar patterns into thin stainless foil without a stamping die or mechanical force. The grating artwork is imaged onto photoresist, developed, and the exposed metal is dissolved in a ferric-chloride spray, so line width, pitch and duty cycle are set by the artwork and etch time rather than by tool pressure. Typical substrates are 304 / 316L and low-expansion Invar 36 between 0.02 mm and 0.3 mm. Because removal is chemical, the grating leaves the line flat, burr-free and stress-free, with straight slot walls and no rolled edges or heat tint — essential when the part is read by an optical encoder, spectrometer or metrology camera.
For buyers of encoder scales, spectrometer slits, alignment reticles and stray-light baffles, the process solves three recurring problems. Punching or laser cutting thin foil leaves dross, burrs and heat-affected edges that scatter light and blur slot boundaries; optical parts demand line width, pitch and cumulative accuracy at the 0.03 mm scale; and any residual stress warps the foil and shifts the optical path. Chemical machining forms every slot on a sheet at the same rate, holding line width and pitch consistent from the first sample through volume production, and an anti-reflective blackening or electropolished finish keeps stray reflections low.
Parameter Window
- Available Materials: 304 / 316L stainless, 430 stainless; also Invar 36 / 316LVM for low-expansion builds
- Material Thickness Range: 0.02–0.3 mm foil
- Tolerance: ±0.005 mm line width, ±0.01 mm pitch, cumulative pitch error specified per 100 mm
- Minimum Feature: 0.03 mm line/slot, 0.03 mm bar, duty cycle up to 50%
- Surface Options: electropolishing, nitric/citric passivation, black oxide / PVD anti-reflective coating, precision dicing, optical-grade clean
- Compliance: ISO 9001 process control, RoHS/REACH material traceability
Manufacturing Process / Workflow (8 Steps)
- Artwork & Pitch Verification — Convert the line/slot pattern to vector art, verify pitch, duty cycle and cumulative error budget.
- Material Certification & Prep — Verify grade, thickness and flatness, then shear to exposure size under clean handling.
- Cleaning & Lamination — Degrease and laminate dry-film resist on both faces to keep fine bars fully supported.
- Double-Sided Exposure — Image front and back with registered photo-tools so slots stay vertical through the foil thickness.
- Development — Wash out unexposed resist to open the slot areas and inspect for residue bridging narrow bars.
- Controlled Etching — Spray ferric chloride tuned to time, temperature and conveyor speed for straight walls and uniform line width.
- Stripping & Blackening — Remove resist, neutralize, then blacken, passivate or electropolish to cut stray reflections.
- Optical Inspection & Clean Packing — Measure line width, pitch and defects on a vision system, then pack flat in clean trays.
Core Advantages
- Straight burr-free walls: Chemical removal leaves clean vertical slot edges with no dross, so optical contrast stays sharp and scattering stays low.
- Ultra-fine uniform pitch: 0.03 mm lines and bars form together across a sheet with tight width spread and consistent duty cycle.
- Stress-free flatness: With no shear or heat input, thin foil stays planar, keeping the optical path and reading head in focus.
- No die cost: Each new grating pattern is a new film, keeping prototype scales and custom pitches economical.
- Cumulative pitch accuracy: Panel-level registration holds line placement over long scales, limiting accumulated error.
- Low-reflection finish: Etched stainless steel grating accepts black oxide, PVD or electropolishing, suppressing stray light in readout systems.
Typical Applications
- Optical encoder scales: Linear and rotary grating scales that set position feedback resolution.
- Spectrometer & monochromator slits: Precision entrance and exit slits with clean, straight edges for defined bandpass.
- Moiré & metrology reticles: Alignment and measurement grids for machine vision and flatness inspection.
- Light baffles & stray-light grids: Fine bar arrays that block off-axis light in optical instruments.
- EMI & optical shielding grids: Conductive meshes that shield while passing a controlled light or air fraction.
- Precision aperture & code arrays: Encoded slot and aperture patterns for sensors and indexing devices.
Design Notes & Process Considerations
- Aspect ratio: Keep slot width at or above material thickness; very narrow, deep slots distort from undercut and thin the bar.
- Pitch and cumulative error: State nominal pitch, tolerance and allowable accumulated error per 100 mm, not just line count.
- Duty cycle callout: Define line-to-bar ratio and open fraction, since contrast and stiffness move together.
- Flatness and mounting: Specify flatness per 100 mm and the mounting method, as clamping can bow a thin scale and shift readings.
- Anti-reflection treatment: Call out blackening, PVD or electropolish and the target reflectance for the detector wavelength.
- Optical cleanliness: With etched stainless steel grating, define particle limits, handling and clean packing, since a single speck can read as a false line.
